Overview
Image ID stm-rhk-sm4
Datetime 2020-01-08
14:13:11
Controller RHK
Op. mode STM
It 0.20 nA
Ub -0.17 V
 
 
Scan size 300 × 300 nm²
Resolution 512 × 512
Line time 158.0 ms
Scan time 80.87 s
Scan direct. right
Offset +1501.2 nm
-269.4 nm
Rotation 116.0°
Image ID stm-nanonis-sxm
Datetime 2021-09-24 15:28:08
Scan Size 20 × 20 nm²
Resolution 256 × 256
Tilt 0.0°
Scan Duration 6.55 s
Line Time 25.60 ms
Offset 138.60 nm, -66.03 nm
ID aes-staib-dat
Datetime 2021-10-19 15:39:56
Mode LockIn
Region 30 - 570 eV
Step 0.99 eV
Sweeps 20
tdwell 123 ms
tretrace 500 ms
Resolution 20.0 %
Resolution Mode dE/E=const.
Image ID afm-nanosurf-nid
Date/time 2022-03-06
14:03:54
Controller Nanosurf
Op. mode Dynamic Force
Cantilever Tap190Al-G
Ampl. ctrl. Free Amp.
Exc. ampl. 351.0 mV
Setpoint 70.0 %
Tip volt. +0.0 mV
 
P/I 12000 / 3000
Scan size 7000 × 7000 nm²
Resolution 256 × 256
Line time 498.0 ms
Scan time 254.98 s
Scan direct. Up
Offset +574.0 nm
-1200.0 nm
Rotation 0.0°
ID aes-staib-vms
Datetime 2022-05-26 15:00:46
Mode analogue
Region 20 - 2200 eV
Step 1.98 eV
Sweeps 1
tdwell 0.503 ms
tretrace 5000.0 ms
Resolution 1.0 %
Resolution Mode 1.0
Image ID stm-nanosurf-nid
Date/time 2023-06-14
11:56:19
Controller Nanosurf
Op. mode STM
It 1.00 nA
Ub +600.0 mV
 
P/I 3000 / 2000
Scan size 20 × 20 nm²
Resolution 256 × 256
Line time 100.0 ms
Scan time 51.20 s
Scan direct. Down
Offset -213.0 nm
-118.0 nm
Rotation 0.0°
File ID CV_185158_ 1
Datetime 2023-07-12
18:51:58
EC Type None
Controller Nordic EC4
Scanrate 0 mV/s
 
EWE_start 1.100 V
ΔEWE 1.000 V
File ID CV_103244_ 1
Datetime 2023-07-18
10:32:44
EC Type None
Controller Nordic EC4
Scanrate 0 mV/s
 
EWE_start 0.700 V
ΔEWE 1.500 V
Image ID data0740
Datetime 2023-07-18
13:30:24
Controller RHK
Op. mode STM
It 1.00 nA
Ub +0.51 V
 
 
Scan size 80 × 80 nm²
Resolution 512 × 512
Line time 50.0 ms
Scan time 25.60 s
Scan direct. right
Offset +151.7 nm
+69.4 nm
Rotation 42.0°
File ID CV_153505_ 1
Datetime 2023-07-18
15:35:05
EC Type None
Controller Nordic EC4
Scanrate 0 mV/s
 
EWE_start 0.800 V
ΔEWE 1.500 V
File ID PS241105-13_1
Datetime 2024-10-29
08:21:43
EC Type Linear Sweep Voltammetry
Controller PalmSens
 
File ID PS241105-14_1
Datetime 2024-10-29
08:21:56
EC Type Impedence Spectroscopy
Controller PalmSens
 
File ID PS241105-2_1
Datetime 2024-11-07
14:48:04
EC Type Chronoamperometry
Controller PalmSens
 
File ID PS241105-3_1
Datetime 2024-11-07
14:48:29
EC Type Cyclic Voltammetry
Controller PalmSens
 
File ID PS241105-1_1
Datetime 2024-12-02
15:15:02
EC Type Chronopotentiometry
Controller PalmSens
 
ID ET_250521_001
Date/time 2025-05-21
11:19:50
Operation Mode ET
Time per pixel 1.0 ms
 
EWE -0.203 V
IWE +1.816E-8 A
Ub +0.304 V
It -6.905E-11 A
Utip -0.508 V
ID AT_250526_002
Date/time 2025-05-26
08:08:30
Operation Mode AT
X-Amplitude 0.075 Vpp
Y-Amplitude 0.075 Vpp
Rotation Phase 90.0 deg
Lock-In Phase 180.0 b'\\udcb0C'
Lock-In Time Constant 0.01 s
Kp 0.01 V
Ti 1.00 ms
Control Time Step 1.00 ms
PI Hardware 0
Circle by circle 0
Number of circles 1
 
EWE -0.203 V
IWE +1.816E-8 A
Ub +0.304 V
It -6.905E-11 A
Utip -0.508 V
ID SI_250605_012
Date/time 2025-06-05
13:00:51
Operation Mode SI
Time per pixel 1.0 ms
 
EWE -0.203 V
IWE +1.816E-8 A
Ub +0.304 V
It -6.905E-11 A
Utip -0.508 V
ID HS_250903_001
Date/time 2025-09-03
11:04:22
Operation Mode HS
Timestep 0.01 ms
ID rga-massscan-test
Datetime 2025-11-17 13:00:37
Software Residual Gas Analyzer Software
Points per amu 10
ID rga-timeseries-test
Datetime 2025-11-17 13:03:24
Software Residual Gas Analyzer Software
Sample period 1.00 sec
ID FS_251120_001
Date/time 2025-11-20
09:47:42
Operation Mode FS
X-Frequency 967.87 Hz
X-Phase -5 px
Y-Phase 0 px
Angle -34.0 deg
 
EWE -0.203 V
IWE +1.816E-8 A
Ub UNDEFINED
It -6.905E-11 A
Utip -0.508 V
Image ID
   (number)
20201111--4_1
11
Datetime 2026-02-19
12:09:45
Controller Matrix
Op. mode STM
It 0.3 nA
Ub +0.6 V
Comment
Data Set
Sample
 
P / I 0.00 / 1.30 %
Scan size 100 × 100 nm²
Resolution 400 × 400
Line time 200.0 ms
Scan time 80.00 s
Scan direct. up
Offset -16.5 nm
+281.5 nm
Rotation
File ID CA_231013_001
Datetime 2026-02-19
12:09:45
EC Type Chronoamperometry
Controller LabView
Timestep 6 ms
 
EWE_start 3.525 V
EWE_max / EWE_min 1.849 / 3.526 V
ΔEWE 1.677 V
 
Ub_start 0.701 V
Ub_max / Ub_min -0.999 / 0.701 V
ΔUb 1.700 V
File ID CV_251010_001
Datetime 2026-02-19
12:09:45
EC Type Cyclic Voltammetry
Controller LabView
Timestep 6 ms
Scanrate 50 mV/s
 
EWE_start -0.212 V
EWE_1 / EWE_2 -0.012 / -0.813 V
ΔEWE 0.801 V
 
Ub_start 0.512 V
Ub_1 / Ub_ 0.513 / 0.512 V
ΔUb 0.001 V
File ID FFT_231013_001
Datetime 2026-02-19
12:09:45
EC Type FFT
Controller LabView
 
ID jpeg_test
Date/time 2026-02-19
12:09:45
ID leed
Date/time 2026-02-19
12:09:45
ID measurement1
Datetime 2026-02-19 12:09:45
ID qcmb-test
Datetime 2026-02-19 12:09:45

stm-aarhus-mul-a.mul

Image ID stm-aarhus-mul-a_1
Datetime 2021-03-12 13:03:29
Itun 0.23 nA
Utun 221.9 mV
Scan Size 100 × 100 nm²
Resolution 512 × 512
Rotation
Scan Duration 77.32 s
Line Time 151.02 ms
Offset 0.00 nm, 0.00 nm
Gain 955
Mode 0
Image ID stm-aarhus-mul-a_2
Datetime 2021-03-12 13:09:24
Itun 0.43 nA
Utun 292.7 mV
Scan Size 100 × 100 nm²
Resolution 512 × 512
Rotation
Scan Duration 82.82 s
Line Time 161.76 ms
Offset 28.20 nm, 636.70 nm
Gain 955
Mode 0
Image ID stm-aarhus-mul-a_3
Datetime 2021-03-12 13:13:03
Itun 0.91 nA
Utun 292.7 mV
Scan Size 100 × 100 nm²
Resolution 512 × 512
Rotation
Scan Duration 123.12 s
Line Time 240.47 ms
Offset -74.30 nm, 803.80 nm
Gain 955
Mode 0
Image ID stm-aarhus-mul-a_4
Datetime 2021-03-12 13:16:51
Itun 0.65 nA
Utun 292.7 mV
Scan Size 100 × 100 nm²
Resolution 512 × 512
Rotation
Scan Duration 129.34 s
Line Time 252.62 ms
Offset -673.20 nm, 580.30 nm
Gain 955
Mode 0

stm-aarhus-mul-b.mul

Image ID stm-aarhus-mul-b_1
Datetime 2021-04-29 10:17:59
Itun 0.35 nA
Utun 1095.6 mV
Scan Size 20 × 20 nm²
Resolution 512 × 512
Rotation
Scan Duration 85.72 s
Line Time 167.42 ms
Offset 115.50 nm, 77.20 nm
Gain 7580
Mode 0
Image ID stm-aarhus-mul-b_2
Datetime 2021-04-29 15:03:19
Itun 0.18 nA
Utun 1250.0 mV
Scan Size 50 × 50 nm²
Resolution 512 × 512
Rotation
Scan Duration 246.34 s
Line Time 481.13 ms
Offset 362.00 nm, -164.40 nm
Gain 8705
Mode 0
Image ID stm-aarhus-mul-b_3
Datetime 2021-04-29 15:09:02
Itun 0.18 nA
Utun 1250.0 mV
Scan Size 20 × 20 nm²
Resolution 512 × 512
Rotation
Scan Duration 151.41 s
Line Time 295.72 ms
Offset 374.40 nm, -165.40 nm
Gain 8705
Mode 0
Image ID stm-aarhus-mul-b_4
Datetime 2021-04-29 15:11:34
Itun 0.16 nA
Utun 1250.0 mV
Scan Size 20 × 20 nm²
Resolution 512 × 512
Rotation
Scan Duration 151.42 s
Line Time 295.74 ms
Offset 374.40 nm, -165.40 nm
Gain 8705
Mode 0
Image ID stm-aarhus-mul-b_5
Datetime 2021-04-29 15:20:43
Itun 0.96 nA
Utun 1250.0 mV
Scan Size 20 × 20 nm²
Resolution 512 × 512
Rotation
Scan Duration 181.53 s
Line Time 354.55 ms
Offset 374.40 nm, -165.40 nm
Gain 9995
Mode 0
Image ID stm-aarhus-mul-b_6
Datetime 2021-04-29 16:09:07
Itun 0.29 nA
Utun 2024.2 mV
Scan Size 20 × 20 nm²
Resolution 512 × 512
Rotation
Scan Duration 181.51 s
Line Time 354.51 ms
Offset 374.40 nm, -165.40 nm
Gain 9995
Mode 0

xps-eis.txt

ID xps-eis_1
Scan Number 1
Datetime 2026-02-19 12:09:45
Region -20.0 - 800.0 eV
Step 0.1 eV
Sweeps 5
Dwell 0.2 s
Epass 50.0 eV
ID xps-eis_2
Scan Number 2
Datetime 2026-02-19 12:09:45
Region 225.0 - 241.0 eV
Step 0.05 eV
Sweeps 10
Dwell 0.5 s
Epass 20.0 eV
ID xps-eis_3
Scan Number 3
Datetime 2026-02-19 12:09:45
Region 389.0 - 436.0 eV
Step 0.05 eV
Sweeps 10
Dwell 0.2 s
Epass 20.0 eV
ID xps-eis_4
Scan Number 4
Datetime 2026-02-19 12:09:45
Region 240.0 - 267.0 eV
Step 0.05 eV
Sweeps 10
Dwell 0.2 s
Epass 20.0 eV