testdata - Report

Overview

Image ID	stm-rhk-sm4
Datetime	2020-01-08 14:13:11
Controller	RHK
Op. mode	STM
I_t	0.20 nA
U_b	-0.17 V



Scan size	300 × 300 nm²
Resolution	512 × 512
Line time	158.0 ms
Scan time	80.87 s
Scan direct.	right
Offset	+1501.2 nm -269.4 nm
Rotation	116.0°

Image ID	stm-nanonis-sxm
Datetime	2021-09-24 15:28:08
Scan Size	20 × 20 nm²
Resolution	256 × 256
Tilt	0.0°
Scan Duration	6.55 s
Line Time	25.60 ms
Offset	138.60 nm, -66.03 nm

ID	aes-staib-dat
Datetime	2021-10-19 15:39:56
Mode	LockIn
Region	30 - 570 eV
Step	0.99 eV
Sweeps	20
t_dwell	123 ms
t_retrace	500 ms
Resolution	20.0 %
Resolution Mode	dE/E=const.

Image ID	afm-nanosurf-nid
Date/time	2022-03-06 14:03:54
Controller	Nanosurf
Op. mode	Dynamic Force
Cantilever	Tap190Al-G
Ampl. ctrl.	Free Amp.
Exc. ampl.	351.0 mV
Setpoint	70.0 %
Tip volt.	+0.0 mV


P/I	12000 / 3000
Scan size	7000 × 7000 nm²
Resolution	256 × 256
Line time	498.0 ms
Scan time	254.98 s
Scan direct.	Up
Offset	+574.0 nm -1200.0 nm
Rotation	0.0°

ID	aes-staib-vms
Datetime	2022-05-26 15:00:46
Mode	analogue
Region	20 - 2200 eV
Step	1.98 eV
Sweeps	1
t_dwell	0.503 ms
t_retrace	5000.0 ms
Resolution	1.0 %
Resolution Mode	1.0

Image ID	stm-nanosurf-nid
Date/time	2023-06-14 11:56:19
Controller	Nanosurf
Op. mode	STM
I_t	1.00 nA
U_b	+600.0 mV


P/I	3000 / 2000
Scan size	20 × 20 nm²
Resolution	256 × 256
Line time	100.0 ms
Scan time	51.20 s
Scan direct.	Down
Offset	-213.0 nm -118.0 nm
Rotation	0.0°

File ID	CV_185158_ 1
Datetime	2023-07-12 18:51:58
EC Type	None
Controller	Nordic EC4
Scanrate	0 mV/s


E_{WE_start}	1.100 V
ΔE_WE	1.000 V

File ID	CV_103244_ 1
Datetime	2023-07-18 10:32:44
EC Type	None
Controller	Nordic EC4
Scanrate	0 mV/s


E_{WE_start}	0.700 V
ΔE_WE	1.500 V

Image ID	data0740
Datetime	2023-07-18 13:30:24
Controller	RHK
Op. mode	STM
I_t	1.00 nA
U_b	+0.51 V



Scan size	80 × 80 nm²
Resolution	512 × 512
Line time	50.0 ms
Scan time	25.60 s
Scan direct.	right
Offset	+151.7 nm +69.4 nm
Rotation	42.0°

File ID	CV_153505_ 1
Datetime	2023-07-18 15:35:05
EC Type	None
Controller	Nordic EC4
Scanrate	0 mV/s


E_{WE_start}	0.800 V
ΔE_WE	1.500 V

File ID	PS241105-13_1
Datetime	2024-10-29 08:21:43
EC Type	Linear Sweep Voltammetry
Controller	PalmSens

File ID	PS241105-14_1
Datetime	2024-10-29 08:21:56
EC Type	Impedence Spectroscopy
Controller	PalmSens

File ID	PS241105-2_1
Datetime	2024-11-07 14:48:04
EC Type	Chronoamperometry
Controller	PalmSens

File ID	PS241105-3_1
Datetime	2024-11-07 14:48:29
EC Type	Cyclic Voltammetry
Controller	PalmSens

File ID	PS241105-1_1
Datetime	2024-12-02 15:15:02
EC Type	Chronopotentiometry
Controller	PalmSens

ID	ET_250521_001
Date/time	2025-05-21 11:19:50
Operation Mode	ET
Time per pixel	1.0 ms


E_WE	-0.203 V
I_WE	+1.816E-8 A
U_b	+0.304 V
I_t	-6.905E-11 A
U_tip	-0.508 V

ID	AT_250526_002
Date/time	2025-05-26 08:08:30
Operation Mode	AT
X-Amplitude	0.075 Vpp
Y-Amplitude	0.075 Vpp
Rotation Phase	90.0 deg
Lock-In Phase	180.0 b'\\udcb0C'
Lock-In Time Constant	0.01 s
K_p	0.01 V
Ti	1.00 ms
Control Time Step	1.00 ms
PI Hardware	0
Circle by circle	0
Number of circles	1


E_WE	-0.203 V
I_WE	+1.816E-8 A
U_b	+0.304 V
I_t	-6.905E-11 A
U_tip	-0.508 V

ID	SI_250605_012
Date/time	2025-06-05 13:00:51
Operation Mode	SI
Time per pixel	1.0 ms


E_WE	-0.203 V
I_WE	+1.816E-8 A
U_b	+0.304 V
I_t	-6.905E-11 A
U_tip	-0.508 V

ID	HS_250903_001
Date/time	2025-09-03 11:04:22
Operation Mode	HS
Timestep	0.01 ms

ID	rga-massscan-test
Datetime	2025-11-17 13:00:37
Software	Residual Gas Analyzer Software
Points per amu	10

ID	rga-timeseries-test
Datetime	2025-11-17 13:03:24
Software	Residual Gas Analyzer Software
Sample period	1.00 sec

ID	FS_251120_001
Date/time	2025-11-20 09:47:42
Operation Mode	FS
X-Frequency	967.87 Hz
X-Phase	-5 px
Y-Phase	0 px
Angle	-34.0 deg


E_WE	-0.203 V
I_WE	+1.816E-8 A
U_b	UNDEFINED
I_t	-6.905E-11 A
U_tip	-0.508 V

Image ID (number)	20201111--4_1 11
Datetime	2026-02-19 12:09:45
Controller	Matrix
Op. mode	STM
I_t	0.3 nA
U_b	+0.6 V
Comment
Data Set
Sample


P / I	0.00 / 1.30 %
Scan size	100 × 100 nm²
Resolution	400 × 400
Line time	200.0 ms
Scan time	80.00 s
Scan direct.	up
Offset	-16.5 nm +281.5 nm
Rotation	0°

File ID	CA_231013_001
Datetime	2026-02-19 12:09:45
EC Type	Chronoamperometry
Controller	LabView
Timestep	6 ms


E_{WE_start}	3.525 V
E_{WE_max} / E_{WE_min}	1.849 / 3.526 V
ΔE_WE	1.677 V

U_{b_start}	0.701 V
U_{b_max} / U_{b_min}	-0.999 / 0.701 V
ΔU_b	1.700 V

File ID	CV_251010_001
Datetime	2026-02-19 12:09:45
EC Type	Cyclic Voltammetry
Controller	LabView
Timestep	6 ms
Scanrate	50 mV/s


E_{WE_start}	-0.212 V
E_{WE_1} / E_{WE_2}	-0.012 / -0.813 V
ΔE_WE	0.801 V

U_{b_start}	0.512 V
U_{b_1} / U_{b_}	0.513 / 0.512 V
ΔU_b	0.001 V

File ID	FFT_231013_001
Datetime	2026-02-19 12:09:45
EC Type	FFT
Controller	LabView

ID	jpeg_test
Date/time	2026-02-19 12:09:45

ID	leed
Date/time	2026-02-19 12:09:45

ID	measurement1
Datetime	2026-02-19 12:09:45

ID	qcmb-test
Datetime	2026-02-19 12:09:45

stm-aarhus-mul-a.mul

Image ID	stm-aarhus-mul-a_1
Datetime	2021-03-12 13:03:29
I_tun	0.23 nA
U_tun	221.9 mV
Scan Size	100 × 100 nm²
Resolution	512 × 512
Rotation	0°
Scan Duration	77.32 s
Line Time	151.02 ms
Offset	0.00 nm, 0.00 nm
Gain	955
Mode	0

Image ID	stm-aarhus-mul-a_2
Datetime	2021-03-12 13:09:24
I_tun	0.43 nA
U_tun	292.7 mV
Scan Size	100 × 100 nm²
Resolution	512 × 512
Rotation	0°
Scan Duration	82.82 s
Line Time	161.76 ms
Offset	28.20 nm, 636.70 nm
Gain	955
Mode	0

Image ID	stm-aarhus-mul-a_3
Datetime	2021-03-12 13:13:03
I_tun	0.91 nA
U_tun	292.7 mV
Scan Size	100 × 100 nm²
Resolution	512 × 512
Rotation	0°
Scan Duration	123.12 s
Line Time	240.47 ms
Offset	-74.30 nm, 803.80 nm
Gain	955
Mode	0

Image ID	stm-aarhus-mul-a_4
Datetime	2021-03-12 13:16:51
I_tun	0.65 nA
U_tun	292.7 mV
Scan Size	100 × 100 nm²
Resolution	512 × 512
Rotation	0°
Scan Duration	129.34 s
Line Time	252.62 ms
Offset	-673.20 nm, 580.30 nm
Gain	955
Mode	0

stm-aarhus-mul-b.mul

Image ID	stm-aarhus-mul-b_1
Datetime	2021-04-29 10:17:59
I_tun	0.35 nA
U_tun	1095.6 mV
Scan Size	20 × 20 nm²
Resolution	512 × 512
Rotation	0°
Scan Duration	85.72 s
Line Time	167.42 ms
Offset	115.50 nm, 77.20 nm
Gain	7580
Mode	0

Image ID	stm-aarhus-mul-b_2
Datetime	2021-04-29 15:03:19
I_tun	0.18 nA
U_tun	1250.0 mV
Scan Size	50 × 50 nm²
Resolution	512 × 512
Rotation	0°
Scan Duration	246.34 s
Line Time	481.13 ms
Offset	362.00 nm, -164.40 nm
Gain	8705
Mode	0

Image ID	stm-aarhus-mul-b_3
Datetime	2021-04-29 15:09:02
I_tun	0.18 nA
U_tun	1250.0 mV
Scan Size	20 × 20 nm²
Resolution	512 × 512
Rotation	0°
Scan Duration	151.41 s
Line Time	295.72 ms
Offset	374.40 nm, -165.40 nm
Gain	8705
Mode	0

Image ID	stm-aarhus-mul-b_4
Datetime	2021-04-29 15:11:34
I_tun	0.16 nA
U_tun	1250.0 mV
Scan Size	20 × 20 nm²
Resolution	512 × 512
Rotation	0°
Scan Duration	151.42 s
Line Time	295.74 ms
Offset	374.40 nm, -165.40 nm
Gain	8705
Mode	0

Image ID	stm-aarhus-mul-b_5
Datetime	2021-04-29 15:20:43
I_tun	0.96 nA
U_tun	1250.0 mV
Scan Size	20 × 20 nm²
Resolution	512 × 512
Rotation	0°
Scan Duration	181.53 s
Line Time	354.55 ms
Offset	374.40 nm, -165.40 nm
Gain	9995
Mode	0

Image ID	stm-aarhus-mul-b_6
Datetime	2021-04-29 16:09:07
I_tun	0.29 nA
U_tun	2024.2 mV
Scan Size	20 × 20 nm²
Resolution	512 × 512
Rotation	0°
Scan Duration	181.51 s
Line Time	354.51 ms
Offset	374.40 nm, -165.40 nm
Gain	9995
Mode	0

xps-eis.txt

ID	xps-eis_1
Scan Number	1
Datetime	2026-02-19 12:09:45
Region	-20.0 - 800.0 eV
Step	0.1 eV
Sweeps	5
Dwell	0.2 s
E_pass	50.0 eV

ID	xps-eis_2
Scan Number	2
Datetime	2026-02-19 12:09:45
Region	225.0 - 241.0 eV
Step	0.05 eV
Sweeps	10
Dwell	0.5 s
E_pass	20.0 eV

ID	xps-eis_3
Scan Number	3
Datetime	2026-02-19 12:09:45
Region	389.0 - 436.0 eV
Step	0.05 eV
Sweeps	10
Dwell	0.2 s
E_pass	20.0 eV

ID	xps-eis_4
Scan Number	4
Datetime	2026-02-19 12:09:45
Region	240.0 - 267.0 eV
Step	0.05 eV
Sweeps	10
Dwell	0.2 s
E_pass	20.0 eV